X-RAY CHARACTERIZATION OF RESISTOR/DIELECTRIC MATERIAL FOR LOW TEMPERATURE CO-FIRED CERAMIC PACKAGES, M.A. Rodriguez, P. Yang, P. Kotula and D. Dimos, pp. 332-337
نویسندگان
چکیده
High temperature XRD has been employed to monitor the devitrification of DuPont 951 low temperature co-fued ceramic (LTCC) and DuPont ES4005 resistor ink. The LTCC underwent devitrification to an anorthite phase in the range of 835-875 ‘C with activation energy of 180 kJ/mol as calculated from kinetic data. The resistor paste underwent devitrification in the 835875 ‘C range forming monoclinic and hexagonal celcian phases plus a phase believed to be a zinc-silicate. RuO2 appeared to be stable within this devitrified resistor matrix. X-ray radiography of a co-fired circuit indicated good structural/chemical compatibility between the resistor and LTCC.
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